Define & document DFT requirements/Specifications for IP/Block and Chip level
Execute DFT Lint to identify scan DRC violations and resolution
Top level and hard macro block level scan insertion with high EDT compression ratio (Hybrid LBIST, EDT IP/ATPG, LPCT EDT, AC scan verification with high speed PLL, MBIST, and IJTAG)
Plan and Insert MBIST and memory repair (BISR) at RTL
Generate and port IJTAG ICL/PDL and STIL patterns for MBIST, ATPG, and JTAG tests
ATPG pattern verification on pre/post-route gate-level netlist including 0-delay and SDF
Work with backend team for the MBIST/Scan mode constraints generation, scan reorder, VCDs for IR drop analysis during DFT, ECO changes and formal verification (LEC), and timing closure
Support test engineer for pattern generation, tester debug and failure analysis.
Work with Test Engineering team during Silicon bring-up and creating flow/scripts necessary for debugging/diagnosing compression LPC ATPG patterns (stuck-at/at speed), MBIST patterns on ATE for development and production programs
Expert knowledge of Mentor Tessent toolchain
Job Requirements
Hands-on hierarchical DFT flow experience from RTL to netlist
Strong knowledge and experience with both JTAG (IEEE1149.1) and IJTAG (1687)
Experience in inserting EDT, wrapper cells and OCC
Experience in analyzing DFT DRC violations and fault coverage analysis
Expertise in ATPG. Debug and resolve ATPG DRC and chain trace issues
Gate level simulations and debug; both 0-delay and with SDF DFT
Expertise in using Cadence for scan stitching and Mentor Tessent tool suite for DFT implementation
Experience in debugging tester/ATE failures, silicon bring-up and yield and test time improvement
Experience in Perl/TCL scripting and good verbal/written communication skills
7+ years of proven DFT execution experience on mixed-signal SoC with first-pass silicon success